Near-field scanning microwave microscope (NSMM)
Imtiaz, Atif Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado.
Wallis, T. Mitchell Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado.
Kabos, Pavel Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado.
- General characteristics
- Near-field configuration
- Resonator-based implementation
- Integration with STM and AFM
- Measurement procedure
- Role of tip-to-sample interaction
- Links to Primary Literature
- Additional Readings
Electromagnetic waves in the microwave frequency range are an essential tool for the investigation of material and device properties across a broad range of applications. Examples of materials of interest include ferroelectric materials, ferromagnetic materials, superconductors, semiconductors, graphene, carbon nanotubes, fullerenes, and life-science materials, among others. These materials are studied at multiple scales, including bulk, thin film, and ideally down to the scale of individual molecules. Examples of devices of interest include: electron charge- and spin-based nanoelectronics, bio-inspired devices, superconducting devices, and magnetoresistive devices, among many others.
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