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Search Results: Ellipsometry

A technique for determining the properties of a material from the characteristics of light reflected from its surface. The materials studied include...


= Encyclopedia Article; = Research Update
Figure 1.Incident, transmitted, and reflected electromagnetic waves at the surface of a material. The angle of incidence shown is the Brewster angle, for which the p-polarized wave in the lower medium points along the reflection direction. The s wave is polarized perpendicular to the plane of the page.
From Encyclopedia article 'Ellipsometry'
Figure 2.Linearly polarized incident and elliptically polarized reflected waves. These represent the trajectories of the respective electric field vectors in the complex plane. Ep and Es are the p and s components of the electric field; |rp| and |rs| are the magnitudes of the complex reflectances.
From Encyclopedia article 'Ellipsometry'
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