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Search Results: Secondary ion mass spectrometry (SIMS)

A surface analysis method for the chemical characterization of multicomponent solids and solid surfaces in many different fields. The powerful...



= Encyclopedia Article; = Research Update
Molecular depth profile of a 300-nm film of a mixture of the sugar trehalose and a small peptide (Gly-Gly-Tyr-Arg, GGYR) coated on a Si substrate. (Courtesy of J. Cheng and N. Winograd, 2005)
From Encyclopedia article 'Secondary ion mass spectrometry (SIMS)'